TY  - GEN
AU  - Egerton, Ray F.
TI  - Physical principles of electron microscopy: an introduction to TEM SEM and AEM
SN  - 9780387258003
U1  - 502.825 
PY  - 2005///
CY  - New york
PB  - Springer
KW  - ELECTRON MICROCOPY
ER  -