Physical principles of electron microscopy an introduction to TEM SEM and AEM

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Language: English Language Publication details: 2005 New york SpringerDescription: Illustration 23 cm. ix , 202 pISBN:

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Sheduled Reference

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Sheduled Reference	Applied Sciences Library Reference Section	Reference Collection	502.825EGE (Browse shelf(Opens below))	Available		55323

Total holds: 0

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